Atomic force microscopy analysis of enamel nanotopography after interproximal reduction

In the April 2017 issue of the AJO-DO, Meredith et al1 evaluated enamel topography after interproximal reduction under atomic force microscopy (AFM). As discussed in many previous studies, AFM uses several high-resolution scans for assessment of enamel topography and has been strongly recommended for this purpose.2-4 This tool has advantages such as the need for minimal preparation of the samples, taking 2-dimensional and 3-dimensional images simultaneously, and allowing reproducible assessment of samples.

http://ift.tt/2iFkzV7